Test Reports

Test Reports are accessed online using the JitterLabs app with a paid subscription.

Devices

Test Reports can be created for the following types of devices.

Devices that generate clock (or clock-like data) signals having output frequencies from 10 MHz to 26+ GHz.

Examples:

Measurements

Devices submitted to JitterLabs will be tested for the following measurements, which depend on the type of device and signal tested. These measurements, and more, are also available for custom testing.

Lower-frequency Digital Signals

Voltage
output, amplitude, top, base, upper, lower, average, RMS, peak-peak, maximum, minimum, crossing, overshoot, preshoot

Time
duty cycle, frequency, period, pulse width, positive pulse width, negative pulse width

Voltage and Time
transition time, slew rate, frequency versus supply voltage, frequency pushing, frequency versus tuning voltage, tuning sensitivity, VCO modulation bandwidth

Jitter
time-interval error, period jitter, cycle-to-cycle (C2C) jitter, pulse-width jitter, positive pulse-width C2C jitter, negative pulse-width C2C jitter, duty-cycle C2C jitter

Phase/AM Noise
phase noise, phase noise versus tuning voltage, amplitude-modulation noise

Power
power supply induced jitter, signal power versus supply voltage, signal power versus tuning voltage, power-supply current versus supply voltage, power-supply current versus tuning voltage, harmonic power, VCO harmonic power versus tuning voltage

Higher-frequency Digital Signals, and Analog Signals

Voltage and Time
frequency versus supply voltage, frequency pushing, frequency versus tuning voltage, tuning sensitivity, VCO modulation bandwidth

Phase/AM Noise
phase noise, phase noise versus tuning voltage, amplitude-modulation noise

Power
power supply induced jitter, output power versus supply voltage, output power versus tuning voltage, power-supply current versus supply voltage, power-supply current versus tuning voltage, harmonic power, VCO harmonic power versus tuning voltage

Notes